Description
Optical metrology platform for semiconductor film thickness and process control. (Product page: *** Product Type: Thin-Film Metrology System
Specifications
- Category
- Other Industrial Products
- Location
- Milpitas, California, United States
- Listed
- 3 weeks ago
- Views
- 9
Atlas
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Milpitas, California, United States
N
nan482359
Identity revealed after deal is confirmed
