Description
Secondary-ion mass spectrometry for trace and depth-profile analysis. (Product page: *** Product Type: SIMS Analysis Service
Specifications
- Category
- Other Industrial Products
- Location
- San Jose, CA 95110, USA
- Listed
- 3 weeks ago
- Views
- 11
Enhanced SIMS
Ask price
San Jose, CA 95110, USA
E
eag857127
Identity revealed after deal is confirmed
