Description
Non-contact electrical metrology system used for process control and materials characterization, measuring electrical parameters of wafers, dielectrics, and interfaces without physical contact.
Specifications
- Category
- Other Industrial Products
- Location
- Milpitas, California, United States
- Listed
- 3 weeks ago
- Views
- 8
FAaST
Ask price
Milpitas, California, United States
N
nan482359
Identity revealed after deal is confirmed
