Description

Scanning electron microscope platform for high-resolution surface and materials inspection; S-4700 is a legacy SEM. | Manufacturer: Hitachi High-Tech | Model/Part: S-4700 Product Type: Metrology & Inspection

Specifications

Category: Other Industrial Products
Location: United States
Listed: 3 weeks ago
Views: 12

Hitachi S-4700 Type II

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United States

A

and605763

Identity revealed after deal is confirmed

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