Description
Overlay, critical-dimension, and z-height metrology system for 100-200mm wafers, designed for power semiconductor, compound semiconductor, and MEMS manufacturing applications.
Specifications
- Category
- Other Industrial Products
- Location
- Milpitas, California, United States
- Listed
- 3 weeks ago
- Views
- 8
IVS
Ask price
Milpitas, California, United States
N
nan482359
Identity revealed after deal is confirmed
