Description

JEOL WS-50VB/8 Inspection Stage Chamber JWS-7555S Wafer Defect Review SEM Spare is a precision motion/mechanical component. Use: It supports or transmits controlled movement in a wafer stage, optical stage or other positioning axis. Machine / Process / Subsystem: JEOL electron-beam and SEM platforms use high-voltage, detector, scan, control and stage electronics for imaging, review and analysis. Key Features & Specifications: • Manufacturer: JEOL • Model / Part No.: WS-50VB/8 • low-play/repeatable mechanical motion • used where accurate positioning and stable motion transfer are required

Specifications

Manufacturer

JEOL

Model

WS-50VB/8

Category

Parts & Accessories

Condition

Used Working

Location

Albuquerque, NM, USA

Listed

1 month ago

Views

14