Description
Automated inspection system for LED/compound-semiconductor substrates and epi layers, including surface-defect and related process-control inspection. | Manufacturer: KLA | Model/Part: Candela CS20 Product Type: Metrology & Inspection
Specifications
- Category
- Other Industrial Products
- Location
- United States
- Listed
- 3 weeks ago
- Views
- 11
KLA Candela CS20
Ask price
United States
A
and605763
Identity revealed after deal is confirmed
