Description
Optical thin-film metrology platform for semiconductor process control. (Product page: *** Product Type: Film Thickness Metrology
Specifications
- Category
- Other Industrial Products
- Location
- 1100 W Campbell Rd # 200, Richardson, TX 75080, USA
- Listed
- 3 weeks ago
- Views
- 10
MetaPULSE
Ask price
1100 W Campbell Rd # 200, Richardson, TX 75080, USA
R
rud092373
Identity revealed after deal is confirmed
