Description

The MX 1018 extends EH Metrology's MX 10 series thickness and TTV measurement capability to 300-450mm silicon wafers, using capacitive sensor pairs to capture detailed radial thickness profiles for large-format wafer geometry inspection.

Specifications

Category

Other Industrial Products

Location

Benzstraße 5, 76185 Karlsruhe, Germany

Listed

3 weeks ago

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8