Description

The MX 102-6 is a manual high-resolution thickness and total thickness variation (TTV) gauge for 100-150mm silicon wafers. It uses a pair of capacitive sensors to sample multiple radial thickness profiles across each wafer for fast, precise flatness measurement.

Specifications

Category

Other Industrial Products

Location

Benzstraße 5, 76185 Karlsruhe, Germany

Listed

3 weeks ago

Views

9