Description

The MX 203-6-33 is a fast contactless geometry gauge for 100-150mm silicon wafers, capable of measuring up to 33 points per wafer in about 10 seconds to characterize thickness and flatness, including variants suited to non-conductive and semi-insulating substrates such as GaAs or SiC.

Specifications

Category

Other Industrial Products

Location

Benzstraße 5, 76185 Karlsruhe, Germany

Listed

3 weeks ago

Views

9