Description
Optical thin-film metrology system for measuring film thickness and optical properties. (Product page: *** Product Type: Thin-Film Metrology System
Specifications
- Category
- Other Industrial Products
- Location
- 1212, 80 Las Colinas Ln, San Jose, CA 95119, United States
- Listed
- 3 weeks ago
- Views
- 9
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Ask price
1212, 80 Las Colinas Ln, San Jose, CA 95119, United States
N
nkt423360
Identity revealed after deal is confirmed
