Description
Surface and depth-profile chemical analysis for semiconductor materials. (Product page: *** Product Type: Secondary Ion Mass Spectrometry
Specifications
- Category
- Other Industrial Products
- Location
- 770 Trademark Dr, Reno, NV 89521, USA
- Listed
- 3 weeks ago
- Views
- 11
SIMS Analysis
Ask price
770 Trademark Dr, Reno, NV 89521, USA
S
sol721915
Identity revealed after deal is confirmed
