Description
Double-sided 300 mm wafer probe system for advanced semiconductor testing. (Product page: *** Product Type: 300 mm Double-Sided Wafer Probe System
Specifications
- Category
- Other Industrial Products
- Location
- 2360 Qume Drive, Suite C, San Jose, California 95131
- Listed
- 3 weeks ago
- Views
- 9
TS3000-DS
Ask price
2360 Qume Drive, Suite C, San Jose, California 95131
M
mpi752512
Identity revealed after deal is confirmed
