Description
Non-contact measurement technologies for wafer thickness, bow, warp and surface characterization. (Product page: *** Product Type: Wafer Metrology System
Specifications
- Category
- Other Industrial Products
- Location
- 205 Industrial Avenue East Lowell, Massachusetts 01852 USA
- Listed
- 3 weeks ago
- Views
- 11
Wafer Thickness Measurement
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205 Industrial Avenue East
Lowell, Massachusetts 01852 USA
M
mic035323
Identity revealed after deal is confirmed
