Description

A FIB-SEM (focused ion beam-scanning electron microscope) combination system from This company's semiconductor wafer fab solutions portfolio, built for fast, nanometer-accurate sample preparation and 3D structural analysis. It supports cross-sectional defect review and failure analysis on advanced semiconductor devices, helping fabs speed up root-cause investigation and process troubleshooting.

Specifications

Category

Other Industrial Products

Location

Carl-Zeiss-Straße 22 73447 Oberkochen Germany

Listed

3 weeks ago

Views

9