Description
Multi-beam scanning electron microscope for high-throughput 2D semiconductor analysis. (Product page: *** Product Type: Multi-Beam SEM
Specifications
- Category
- Other Industrial Products
- Location
- Carl-Zeiss-Straße 22 73447 Oberkochen Germany
- Listed
- 3 weeks ago
- Views
- 12
ZEISS MultiSEM
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Carl-Zeiss-Straße 22 73447 Oberkochen Germany
Z
zei743234
Identity revealed after deal is confirmed
