Description

Rigaku's CDSAXS (Critical Dimension Small-Angle X-ray Scattering) Systems deliver X-ray-based critical dimension metrology for measuring nanoscale feature shapes and profiles on patterned semiconductor structures, complementing optical and electron-beam CD metrology methods.

Specifications

Category

Other Industrial Products

Location

9009 New Trails Dr, The Woodlands, TX 77381, USA

Listed

3 weeks ago

Views

13