Description
Optical film thickness metrology system used to measure thin-film properties on semiconductor wafers as part of the company's optical metrology product portfolio.
Specifications
- Category
- Other Industrial Products
- Location
- Milpitas, California, United States
- Listed
- 3 weeks ago
- Views
- 10
Element
Ask price
Milpitas, California, United States
N
nan482359
Identity revealed after deal is confirmed
