Description

Year: 2002 Condition: Used Location: Japan Equipment Details Equipment Type: Analytical Instrument Category: Semiconductor Metrology / Inspection Subcategory: Analytical Instruments Description This 2002 analytical instrument is offered in used condition and is categorized for semiconductor metrology and inspection applications. The original listing provides very limited technical information. Manufacturer, model, measurement technology, sample or wafer size, system configuration, software, included accessories, and current operational condition are not specified. Detailed specifications and equipment configuration should be confirmed with the seller before purchase. Clarify the instrument before buying

Specifications

Location

Japan

Listed

1 month ago

Views

14