Description

The MX 1012 is a high-resolution thickness and TTV gauge for 200-300mm silicon wafers, using a pair of capacitive sensors that sample multiple radial profiles per wafer, each consisting of hundreds of local thickness readings, for precise geometry characterization.

Specifications

Category

Other Industrial Products

Location

Benzstraße 5, 76185 Karlsruhe, Germany

Listed

3 weeks ago

Views

10