Description
Thin-film thickness measurement systems for semiconductor process control. (Product page: *** Product Type: Film Thickness Metrology
Specifications
- Category
- Other Industrial Products
- Location
- Milpitas, California, United States
- Listed
- 3 weeks ago
- Views
- 10
Nanospec
Ask price
Milpitas, California, United States
N
nan482359
Identity revealed after deal is confirmed
