Description

Optical wafer metrology platform for film thickness, reflectance and process characterization. (Product page: *** Product Type: Wafer Metrology System

Specifications

Category: Other Industrial Products
Location: 2390 Bering Dr, San Jose, CA 95131, USA
Listed: 3 weeks ago
Views: 12

Solaris 9500

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2390 Bering Dr, San Jose, CA 95131, USA

S

sol602188

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