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Description

Non-contact optical measurement technology for thin-film thickness and material characterization. (Product page: *** Product Type: Film Metrology

Specifications

Category
Other Industrial Products
Location
1212, 80 Las Colinas Ln, San Jose, CA 95119, United States
Listed
3 weeks ago
Views
9

Spectroscopic Reflectometry

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1212, 80 Las Colinas Ln, San Jose, CA 95119, United States
N

nkt423360

Identity revealed after deal is confirmed

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