Description

Rigaku's TXRF (Total Reflection X-ray Fluorescence) Series analyzers detect trace surface contamination on semiconductor wafers with high sensitivity, using integrated vapor-phase decomposition sample preparation to enable precise quantitative analysis of thin films and surface impurities during fab process control.

Specifications

Category

Other Industrial Products

Location

9009 New Trails Dr, The Woodlands, TX 77381, USA

Listed

3 weeks ago

Views

13