Description
Optical thin-film measurement system for semiconductor process control. (Product page: *** Product Type: Film Metrology
Specifications
- Category
- Other Industrial Products
- Location
- Budapest, Prielle Kornélia u. 2, 1117 Hungary
- Listed
- 3 weeks ago
- Views
- 13
UV-NIR Spectroscopic Ellipsometer
Ask price
Budapest, Prielle Kornélia u. 2, 1117 Hungary
S
sem842690
Identity revealed after deal is confirmed
