Description

The W Series utilizes poly-capillary optics to focus the X-ray beam to 7.5 µm FWHM, the world’s smallest for coating thickness analysis using XRF instruments. A 140X magnification camera allows precise measurement of features at this scale, complemented by a secondary low-magnification camera for live sample viewing and macro-view imaging. Advanced Dual-Camera System Bowman’s dual-camera system enables operators to see the entire part, zoom in with high-magnification, and pinpoint the feature to be programmed and measured with a simple click. General Specifications X-ray Excitation: 50 W Mo target Flex-Beam Capillary Optics @7.5 FWHM (Optional: Cr or W) Analysis Layers & Elements: Measures up to 5 layers (4 layers + base) and 10 elements per layer; composition analysis of up to 25 elements simultaneously Detector: Large-window Silicon Drift Detector (SDD) with 135eV resolution or better Primary Filters: 4 primary filters Focal Depth: Fixed at 0.02” Programmable XYZ Stage: XYZ Travel: 300mm x 400mm x 100mm XY Tabletop: 305mm x 406mm X-axis accuracy: 2.5µm (100µ”), precision: 1µm (40µ”) Y-axis accuracy: 3µm (120µ”), precision: 1µm (40µ”) Z-axis accuracy: 1.25µm (50µ”), precision: 1µm (40µ”) Digital Pulse Processing: 4096 CH digital multi-channel analyzer with automatic *** processing, including dead time correction and escape peak correction Camera Optics: 1/4” CMOS, 1280×720 VGA resolution

Specifications

Condition

NEW

Listed

1 month ago

Views

21