Description

Rigaku's WDXRF (Wavelength Dispersive X-ray Fluorescence) Series, which includes the AZX 400 and WaferX 310 systems, measures material thickness and elemental composition on semiconductor wafers, with particular strength in detecting light elements important to thin-film process monitoring.

Specifications

Category

Other Industrial Products

Location

9009 New Trails Dr, The Woodlands, TX 77381, USA

Listed

3 weeks ago

Views

13