Description

The XT H Series is Nikon Metrology's microfocus X-ray CT scanner line for high-resolution, non-destructive inspection of parts ranging from small plastic connectors to aluminum castings. It uses a 225kV Rotating Target source, X.Tend Helical CT to scan tall parts without cone-beam artifacts, and Half.Turn CT to speed up acquisitions, with a metrology-grade MCT225 variant that delivers traceable dimensional measurement per VDI/VDE 2630 for R&D, failure analysis and production quality control.

Specifications

Category

Other Industrial Products

Location

12701 Grand River Avenue Brighton, MI 48116 U.S.A.

Listed

3 weeks ago

Views

9