Description

Manufacturer: Applied Materials (AMAT) Model: SEMVision G2 Year: 2005 Condition: Used Wafer Size: 200 mm Location: Ireland Equipment Details Equipment Type: SEM Defect Review Station Configuration: Module Only Application: Semiconductor Wafer Defect Review Category: Semiconductor Metrology / Inspection Subcategory: Front-End Semiconductor Equipment Key Features SEM-Based Defect Review 200 mm Wafer Capability High-Resolution Defect Imaging Wafer Defect Analysis Semiconductor Process Monitoring Failure and Yield Analysis Description The Applied Materials SEMVision G2 is an SEM-based defect review system designed for detailed inspection and analysis of defects detected on semiconductor wafers. This unit is configured for 200 mm wafers and is intended for semiconductor defect review, process monitoring, failure analysis, and yield-improvement applications. The equipment is offered as a module only. Buyers should confirm exactly which components, electronics, computer, software, wafer-handling hardware, vacuum equipment, and accessories are included before purchase.

Specifications

Manufacturer

AMAT

Category

Metrology & Inspection

Condition

USED

Listed

1 month ago

Views

11