Metrology & Inspection (284)
Lam 4520XLE
$84,000
Location:
United States
Condition:
USED
Europlacer Tray Sequencer
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Location:
France
Condition:
USED
XYZTec Condor 100 100-3
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Location:
Switzerland
Condition:
USED
Electro Design MB 706
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Location:
Denmark
Condition:
USED
Electro Design MB 750
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Location:
Odense, Denmark
Condition:
USED
Lam Research TCP 9600 SE Etcher
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Location:
USA
Condition:
USED
KLA Tencor MicroXAM2 Interferometer System with Interface Box, Lamp PSU
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Location:
United Kingdom
Condition:
USED
Particle Tester KLA-Tencor CANDELA CS2
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Location:
Asia
Condition:
USED
KLA-Tencor 5200XP
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Location:
Asia
Condition:
USED
KLA TENCOR P-10
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Location:
South Korea
Condition:
USED
2
KLA-Tencor P-10 Surface Profiler
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Location:
Hong Kong
Condition:
USED
KLA-Tencor P-10 Surface Profiler
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Location:
USA
Condition:
USED
KLA TENCOR P10
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Location:
USA
Condition:
USED
KLA TENCOR P10
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Location:
CA, USA
Condition:
USED
KLA Tencor P10 Surface Profiler
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Location:
CA, USA
Condition:
Refurbished
Hitachi S-3400N Scanning Electron Microscope
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Location:
China
Condition:
USED
Hitachi S-2600N Scanning Electron Microscope + Oxford X-Max 50 mm2 Inca detector
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Location:
UK
Condition:
USED
Hitachi S4000 Microscope (SEM) Scanning Electron Microscope Lab
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Location:
UK
Condition:
USED
Rigaku Wafer X 300
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Location:
South Korea
Condition:
USED
Rigaku UltimaIV 382156
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Location:
USA
Condition:
USED