Description

KLA-TENCOR P-10 PROFILER consisting of:- Model: P-10- Manual wafer load profilometer- Max wafer size: 8"/200mm- Computer controlled- Measures roughness, waviness, step height, and other surface characteristics- Measures micro-roughness with up to 0.5Å (0.002 min.) resolution over short distances as well as waviness over a full, 60-mm scan.i thin- Built-in PC computing power- Operating System: Windows 3.1- Windows base software control and data analysis- Brand new stylus- Brand new LCD monitor- Lab Table for KLA P10 Profiler- Operations Manual- Refurbished to Meet Original KLA-Tencor P-10 Specifications- Available for Full Inspection and Demonstration!- 6 Months Warranty on Parts and Labor (Stylus is not covered under warranty)More Information about the KLA P-10 Profiler:- Measurement of vertical features ranging from under 100Å (0.4 min.) to approximately 300 µm (11 mils), with a vertical resolution of 0.5, 2, or 10Å.