Hitachi S-3400N Scanning Electron Microscope

Description

Hitachi Model S-3400N Scanning Electron Microscope with TMP molecular pump vacuum system saves floor space and power supply power consumption. It is mainly used for the effective analysis of the microscopic morphology, organization and composition of materials. Scanning Electron Microscope DetailsThis equipment has a newly developed electron optical system and automated function display system has excellent performance such as full screen display, flicker-free, high pixel and real-time image display, it can also real-time *** mixing and simultaneously display two different detector observed by each other different sample information. Enhancing the analytical power and operability of the SEM through high image quality, the high-sensitivity semiconductor backscattered electron detector can be operated in fast scanning mode, which makes it easier and more convenient to find regions of interest in large-size samples.