Description

Hitachi TM4000Plus Desktop Scanning Electron Microscope (SEM) Manufacturer: Hitachi High-Tech Model: TM4000Plus Condition: Used Country of Origin: Japan Specifications Electron Gun: Tungsten Filament Accelerating Voltage: 5 kV, 10 kV, 15 kV, 20 kV Magnification: 10× – 100,000× Maximum Sample Size: Diameter ≤ 80 mm, Thickness ≤ 50 mm Specimen Stage Travel: X: 40 mm, Y: 35 mm Vacuum Mode: Low Vacuum Mode Detector: High-Sensitivity Backscattered Electron Detector (BSE) Optional Detector: Secondary Electron (SE) Imaging Optional Analysis: EDS Equipment Details Equipment Type: Desktop / Benchtop Scanning Electron Microscope Category: Metrology / Inspection Subcategory: Laboratory Equipment / Second-Hand Instruments Key Features Low Vacuum Imaging: Allows direct observation of insulating, powder, and certain wet samples without requiring gold coating. Charge Reduction Mode: One-click switching helps suppress surface charging of insulating samples. Automatic Operation: Auto-focus and automatic brightness/contrast adjustment simplify imaging and help operators obtain clear images quickly. Camera Navigation (Optional): Integrated optical camera enables convenient visual sample positioning. Filament Monitoring: Real-time monitoring of filament condition provides early warning for replacement and helps reduce unexpected interruptions. Automatic OQ: Automatically generates equipment status reports for maintenance and compliance management. Report Generation: Built-in reporting capabilities allow convenient generation and export of inspection and analysis results. Applications Materials Science: Morphology analysis of metal fractures, coatings, composites, and other materials. Semiconductor & Electronics: PCB solder joint inspection, semiconductor packaging analysis, and defect detection. Life Sciences & Food: Observation of pollen, insects, food particles, fibers, and biological structures. Geology & Mining: Analysis of minerals and soil particle morphology, with composition analysis available when configured with EDS. Education & Research: Suitable for universities, vocational colleges, research laboratories, and SEM training applications. Service Information Product Lead Time: 14 Days Installation & Commissioning: Within 30 Days After Receipt Training: Free On-Site Training During Installation and Commissioning Telephone Support Response: Within 24 Hours Maintenance Contract: Available Maintenance Response: Within 3 Days Core Parts Lead Time: Within 7 Days Core Component Support: 10 Years On-Site Inspection: Available Preventive Maintenance Plan: Available Paid Application Support: Available Description The Hitachi TM4000Plus is a compact desktop scanning electron microscope designed for fast and convenient high-quality imaging. Its low-vacuum capability enables observation of many non-conductive and insulating samples without complex conductive coating preparation. The system combines automated focusing, brightness and contrast adjustment, charge reduction, and intuitive sample navigation to simplify routine SEM operation. The TM4000Plus is suitable for materials characterization, semiconductor and electronics inspection, life-science research, geological analysis, education, and general laboratory applications. Optional EDS capability can further extend the system to elemental and compositional analysis.