Description

Hitachi S-4700 Scanning Electron Microscope is an inspection/metrology component or subsystem. Use: It supports imaging, defect detection, review or dimensional/process-control measurements. Machine / Process / Subsystem: This OEM supplies components or subsystems used in semiconductor, laboratory, test or industrial automation equipment. Key Features & Specifications: • Manufacturer: Hitachi • Model / Part No.: S-4700 • inspection/process-control function • used to detect, image or characterize wafer/device features

Specifications

Manufacturer

Hitachi

Model

S-4700

Category

Metrology & Inspection

Condition

Used

Location

United States

Listed

1 month ago

Views

13