Description

JEOL Inspection Stage Chamber Assembly JWS-2000 Wafer Defect Review SEM Working is a precision motion/mechanical component. Use: It supports or transmits controlled movement in a wafer stage, optical stage or other positioning axis. Machine / Process / Subsystem: JEOL electron-beam and SEM platforms use high-voltage, detector, scan, control and stage electronics for imaging, review and analysis. Key Features & Specifications: • Manufacturer: JEOL • Model / Part No.: Inspection Stage Chamber Assembly • low-play/repeatable mechanical motion • used where accurate positioning and stable motion transfer are required

Specifications

Manufacturer

JEOL

Model

Inspection Stage Chamber Assembly

Category

Metrology & Inspection

Condition

Used Working

Location

Albuquerque, NM, USA

Listed

1 month ago

Views

15