Description

Equipment Details Stock Number: 2304101 Wafer Size: 300 mm Category: Test & Measurement – Semiconductors Subcategory: Semiconductor Equipment Type: Particle Inspection Listing ID: *** Current Condition De-installed Warehoused Available for inspection Description The KLA-Tencor Surfscan SP2 is a semiconductor wafer surface inspection system designed for high-sensitivity detection of particles, scratches, and other surface defects on wafers. The system combines advanced optical inspection technology with automated wafer handling and defect reporting, making it suitable for semiconductor fabrication facilities, R&D environments, and semiconductor testing laboratories. It helps manufacturers identify surface contamination and defects, improve process control, and enhance overall wafer yield.