Description

About KLA-Tencor P-11 The KLA-Tencor P-11 is a precision metrology/inspection system designed for semiconductor fabs and research labs. It delivers reliable defect detection and surface characterization to support process control and yield improvement. Compact and engineered for integration into production environments, the P-11 helps engineers quickly identify particle, pattern and film irregularities across wafers with high throughput and repeatable results.

Specifications

Category

Metrology & Inspection

Condition

USED

Location

Yongin-si, South Korea

Listed

1 month ago

Views

14