Description
Rudolph AutoEL III Ellipsometer Manufacturer: Rudolph Model: AutoEL III Year: 1981 Condition: Used Wafer Size: 6 Inch Location: South Korea Specifications Wafer Size: 6 Inch Equipment Type: Ellipsometer / Thin Film Metrology System Category: Semiconductor Metrology / Inspection Subcategory: Front-End Equipment / Metrology Equipment Measurement Capability Thin Film Thickness Measurement Optical Property Characterization Non-Destructive Optical Measurement Semiconductor Wafer Film Analysis
Specifications
- Category
- Metrology & Inspection
- Condition
- USED
- Location
- South Korea
- Listed
- 1 month ago
- Views
- 12
RUDOLPH III24A
Ask price
South Korea
S
sbx320393
Identity revealed after deal is confirmed
Contact Seller
Related Products
Lam 4520XLE
$84,000
Europlacer Tray Sequencer
Ask price
XYZTec Condor 100 100-3
Ask price
Electro Design MB 706
Ask price
Electro Design MB 750
Ask price
Lam Research TCP 9600 SE Etcher
Ask price
KLA Tencor MicroXAM2 Interferometer System with Interface Box, Lamp PSU
Ask price
Particle Tester KLA-Tencor CANDELA CS2
Ask price