Description

The Keysight / Agilent 4156C Precision Semiconductor Parameter Analyzer provides highly accurate laboratory benchtop parameter analyzers for advanced device characterization. The superior low-current and low-voltage resolution and built-in quasi-static CV measurement capability of the Keysight / Agilent 4156C Analyzer provide a firm foundation for future expansion with other measurement instruments. Features and Specifications of the Keysight / Agilent 4156C Analyzer include: ●Four built-in high-resolution source /monitor units, 2-voltage source units; 2-voltage monitor units ●Develops new process technologies and evaluates materials with measurements to 1 fA and 0.2 uV ●Full Kelvin; force, sense, and guard terminals for each HRSMU ●Performs quasi-static capacitance measurements versus voltage measurements ●Automatically extracts process parameters without manually manipulating screen markers ●Measures leakage characteristics with ultra-low leakage SMUs ●Automates device characterization with integrated pulse generators and selector switches ●Performs on-wafer reliability tests with built-in stressing modes ●Performs point-and-click measurements with graphical user interface ●Provides graphical data analysis capabilities with a Windows environment ●Knob sweep function verifies each probe is making contact ●Stand-by mode eliminating need for external power supplies ●Triggering modes allow synchronized AC/DC measurements ●IBASIC user functions that allows all data to be plotted and analyzed

Specifications

Category

Semiconductor & Electronics

Condition

USED

Location

Shenzhen, Guangdong, China

Listed

1 month ago

Views

31