Description

Specifications Electron Gun: Tungsten Filament Accelerating Voltage: 5 kV, 10 kV, 15 kV, 20 kV Magnification: 10× – 100,000× Maximum Sample Size: Diameter ≤ 80 mm, Thickness ≤ 50 mm Specimen Stage Travel: X: 40 mm, Y: 35 mm Vacuum Mode: Low Vacuum Mode Detector: High-Sensitivity Backscattered Electron Detector (BSE) Optional Detector: Secondary Electron (SE) Imaging Optional Analysis: EDS Equipment Details Equipment Type: Desktop / Benchtop Scanning Electron Microscope Category: Semiconductor Metrology / Inspection Subcategory: Laboratory Equipment / Second-Hand Instruments Key Features Low Vacuum Imaging: Allows direct observation of insulating materials, powders, and certain wet samples without requiring gold coating. Charge Reduction Mode: One-click switching effectively suppresses surface charging of insulating samples. High Automation: Auto-focus and automatic brightness/contrast adjustment simplify operation. Samples can be loaded and clear images obtained with minimal operator input. Camera Navigation (Optional): Integrated optical camera provides true-to-view sample positioning for easier navigation. Filament Monitoring: Real-time filament life monitoring provides early replacement warnings to help prevent interruptions during operation. Automatic OQ: Automatic Operation Qualification functionality generates equipment status reports for maintenance and compliance management. Report Creator: Built-in Report Creator supports quick image reporting and convenient export to Word, Excel, and PowerPoint formats. Optional EDS: The system can be configured with an EDS detector for elemental and compositional analysis. Applications Materials Science: Morphology analysis of metal fractures, coatings, composites, ceramics, plastics, powders, and other materials. Semiconductor & Electronics: PCB solder joint inspection, chip packaging analysis, and defect detection. Life Sciences & Food: Observation of pollen, insects, food particles, fibers, plants, and other biological samples. Geology & Mining: Mineral and soil particle morphology analysis, with compositional analysis when equipped with EDS. Education: Suitable for universities, vocational colleges, research laboratories, and basic SEM teaching applications. Service Information Product Lead Time: 14 Days Installation & Commissioning: Within 30 Days After Receipt Training: Free On-Site Training During Installation and Commissioning Telephone Support Response: Within 24 Hours Maintenance Contract: Available Maintenance Response Time: Within 3 Days Core Parts Lead Time: Within 7 Days Core Component Support: 10 Years On-Site Inspection: Available Preventive Maintenance Plan: Available Paid Application Support: Available Maintenance Payment: Repair First, Pay Later Description The Hitachi TM4000Plus is a compact desktop/benchtop scanning electron microscope designed for fast, convenient, and high-quality sample imaging. Its low-vacuum capability enables direct observation of many non-conductive and insulating samples without complex conductive coating preparation. Materials such as plastics, ceramics, powders, plants, and food samples can be examined with simplified sample preparation. The TM4000Plus combines automatic focusing, automatic brightness and contrast adjustment, charge reduction, and intuitive sample navigation to provide an efficient SEM workflow. It is well suited for materials characterization, semiconductor and electronics inspection, life-science research, geological analysis, education, and general laboratory applications. Optional EDS capability extends the system to elemental and compositional analysis.