Description

Equipment Details Specifications Condition: Used Year: 2000 Stock Number: 1711103 Wafer Size: 200 mm Category: Test & Measurement – Semiconductors Subcategory: Semiconductor Equipment Type: Bright Field Inspection Listing ID: *** Current Condition * De-installed * Warehoused * Available for inspection Description This Bright Field Inspection System is designed for semiconductor wafer inspection and defect detection. The system supports 200 mm wafers and is suitable for identifying surface defects and abnormalities using bright-field inspection technology. It can be used in semiconductor manufacturing, process monitoring, quality control, and R&D environments. The equipment has been de-installed and is currently warehoused. It is available for inspection upon request.