Description
The WaferX 310 is a WDXRF metrology system from Rigaku designed for semiconductor wafer analysis, providing thickness and compositional measurement including light-element sensitivity for thin-film characterization. Product Type: Semiconductor & Wafer Materials
Specifications
- Category
- Semiconductor & Electronics
- Location
- 9009 New Trails Dr, The Woodlands, TX 77381, USA
- Listed
- 3 weeks ago
- Views
- 16
WaferX 310
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9009 New Trails Dr, The Woodlands, TX 77381, USA
R
rig364011
Identity revealed after deal is confirmed
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